Loughborough University
Browse
RevSciInstrum_73_1293.pdf (1.12 MB)

Noninvasive imaging of signals in digital circuits

Download (1.12 MB)
journal contribution
posted on 2013-04-08, 11:00 authored by W. Gebrial, R.J. Prance, T.D. Clark, C.J. Harland, H. Prance, Mark EverittMark Everitt
In this article we describe the construction and use of a noninvasive (noncontact) electric potential probe to measure time delays of signals propagating through digital circuits. As we show, by incorporating such probes into a scanning microscope system we have been able to create time delay images of these signals.We suggest that future developments of this technique may lead to real time, high resolution imaging of digital pulses across complex very large scale integrated circuits.

History

School

  • Science

Department

  • Physics

Citation

GEBRIAL, W. ... et al., 2002. Noninvasive imaging of signals in digital circuits. Review of Scientific Instruments, 73 (3), pp. 1293 - 1298.

Publisher

© American Institute of Physics

Version

  • VoR (Version of Record)

Publication date

2002

Notes

This article was published in the Review of Scientific Instruments [© American Institute of Physics] and the definitive version is available at: http://dx.doi.org/10.1063/1.1447302

ISSN

0034-6748

Language

  • en

Usage metrics

    Loughborough Publications

    Exports

    RefWorks
    BibTeX
    Ref. manager
    Endnote
    DataCite
    NLM
    DC