RevSciInstrum_73_1293.pdf (1.12 MB)
Noninvasive imaging of signals in digital circuits
journal contribution
posted on 2013-04-08, 11:00 authored by W. Gebrial, R.J. Prance, T.D. Clark, C.J. Harland, H. Prance, Mark EverittMark EverittIn this article we describe the construction and use of a noninvasive (noncontact) electric potential
probe to measure time delays of signals propagating through digital circuits. As we show, by
incorporating such probes into a scanning microscope system we have been able to create time delay
images of these signals.We suggest that future developments of this technique may lead to real time,
high resolution imaging of digital pulses across complex very large scale integrated circuits.
History
School
- Science
Department
- Physics
Citation
GEBRIAL, W. ... et al., 2002. Noninvasive imaging of signals in digital circuits. Review of Scientific Instruments, 73 (3), pp. 1293 - 1298.Publisher
© American Institute of PhysicsVersion
- VoR (Version of Record)
Publication date
2002Notes
This article was published in the Review of Scientific Instruments [© American Institute of Physics] and the definitive version is available at: http://dx.doi.org/10.1063/1.1447302ISSN
0034-6748Publisher version
Language
- en