PVSAT-13_177_Tsai_7qRdL3k.pdf (234.38 kB)
Evaluation of effective carrier lifetime of CdTe solar cells using transient photovoltage decay measurements
conference contribution
posted on 2017-06-09, 15:43 authored by Vincent Tsai, George Koutsourakis, Martin BlissMartin Bliss, Tom BettsTom Betts, Ralph GottschalgA transient photovoltage decay (TPVD) measurement system is currently being developed at CREST and measurements were conducted on several CdTe solar cells. The extracted effective carrier lifetimes were around 100ns. The effect of external illumination biasing was investigated and was found to
reduce the effect of junction capacitance and saturate trap states in the devices. This resulted in shorter extracted effective carrier lifetimes. Increasing the illumination of the pulsed-laser intensity also increased the effective carrier
lifetime.
History
School
- Mechanical, Electrical and Manufacturing Engineering
Published in
13th Photovoltaic Science, Application and Technology ConferenceCitation
TSAI, V. ... et al, 2017. Evaluation of effective carrier lifetime of CdTe solar cells using transient photovoltage decay measurements. 13th Photovoltaic Science, Application and Technology Conference (PVSAT-13), Bangor, UK, 5th-7th April 2017.Publisher
© The Solar Energy SocietyVersion
- AM (Accepted Manuscript)
Publisher statement
This work is made available according to the conditions of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0) licence. Full details of this licence are available at: https://creativecommons.org/licenses/by-nc-nd/4.0/Acceptance date
2017-04-05Publication date
2017Notes
This is a conference paper.Publisher version
Language
- en
