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Accurate characterisation of hole geometries by fringe projection profilometry
conference contribution
posted on 2017-08-08, 10:24 authored by Yuxiang Wu, Harshana Dantanarayana, Huimin Yue, Jonathan HuntleyAccurate localisation and characterisation of holes is often required in the field of automated assembly and quality control. Compared to time consuming coordinate measuring machines (CMM), fringe-projection-based 3D scanners offer an attractive alternative as a fast, non-contact measurement technique that provides a dense 3D point cloud of a large sample in a few seconds. However, as we show in this paper, measurement artefacts occur at such hole edges, which can introduce errors in the estimated hole diameter by well over 0.25 mm, even though the estimated hole centre
locations are largely unaffected. A compensation technique to suppress these measurement artefacts has been developed,
by modelling the artefact using data extrapolated from neighboring pixels. By further incorporating a sub-pixel edge
detection technique, we have been able to reduce the root mean square (RMS) diameter errors by up to 9.3 times using the proposed combined method.
Funding
This work was supported by the Engineering and Physical Sciences Research Council under the Light Controlled Factory project EP/K018124/1.
History
School
- Mechanical, Electrical and Manufacturing Engineering
Published in
Videometrics, Range Imaging, and Applications XIVVolume
1033204Citation
WU, Y. ...et al., 2017. Accurate characterisation of hole geometries by fringe projection profilometry. Proc. SPIE 10332, Videometrics, Range Imaging, and Applications XIV, 1033204 (June 26, 2017); doi:10.1117/12.2270210.Publisher
© SPIEVersion
- VoR (Version of Record)
Acceptance date
2017-07-07Publication date
2017Notes
Copyright 2017 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.Publisher version
Book series
Proceedings of SPIE;10332Language
- en