Thesis-1992-Kerr.pdf (7.01 MB)
Extraction of displacement data from Electronic Speckle Pattern Interferometric fringe patterns using digital image processing techniques
thesis
posted on 2018-01-19, 15:29 authored by David KerrThe commercial exploitation of Electronic Speckle Pattern
Interferometry (ESPI) is now gathering pace with manufacturers
marketing products in Europe and the USA. The power of the technique
both in a research and an industrial inspection role has brought
pressure from the engineering community for an automated fringe
analysis system. [Continues.]
Funding
Science and Engineering Research Council, ACME Directorate.
History
School
- Mechanical, Electrical and Manufacturing Engineering
Publisher
© David KerrPublisher statement
This work is made available according to the conditions of the Creative Commons Attribution-NonCommercial-NoDerivatives 2.5 Generic (CC BY-NC-ND 2.5) licence. Full details of this licence are available at: http://creativecommons.org/licenses/by-nc-nd/2.5/Publication date
1992Notes
A Doctoral Thesis. Submitted in partial fulfilment of the requirements for the award of Doctor of Philosophy at Loughborough University.Language
- en