98_RAMS_BEOrd_JDA&LMB.pdf (688.46 kB)
Efficient basic event orderings for binary decision diagrams
Over the last five years significant advances have been
made in methodologies to analyse the fault tree diagram.
The most successful of these developments has been the
Binary Decision Diagram (BDD) approach. The Binary
Decision Diagram approach has been shown to improve
both the efficiency of determining the minimal cut sets of
the fault tree ancl also the accuracy of the calculation
procedure used to determine the top event parameters. The
BDD technique povides a potential alternative to the
traditional approaches based on Kinetic Tree Theory.
To utilise the Binary Decision Diagram approach the
fault tree structure is first converted to the BDD format.
This conversion can be accomplished efficiently but
requires the basic events in the fault tree to be placed in an
ordering. A poor ordering can result in a Binary Decision
Diagram which is not an efficient representation of the fault
tree logic structure. The advantages to be gained by
utilising the BDD technique rely on the efficiency of the
ordering scheme. Alternative ordering schemes have been
investigated and no one scheme is appropriate for every
tree structure. Research to date has not found any rule
based means of determining the best way of ordering basic
events for a given fault tree structure.
The work presented in this paper takes a machine
learning approach based on Genetic Algorithms to select
the most appropriate ordering scheme. Features which
describe a fault tree structure have been identified and
these provide the inputs to the machine learning algorithm.
A set of possible ordering schemes has been selected based
on previous heuristic work. The objective of the work
detailed in the pap:r is to predict the most efficient of the
possible ordering alternatives from parameters which
describe a fault tree structure.
History
School
- Aeronautical, Automotive, Chemical and Materials Engineering
Department
- Aeronautical and Automotive Engineering
Citation
ANDREWS, J.D. and BARTLETT, L.M., 1998. Efficient basic event orderings for binary decision diagrams. IN: Annual Reliability and Maintainability Symposium. 1998 Proceedings. International Symposium on Product Quality and Integrity, Anahiem, Los Angeles, 19-22 January, pp. 61-68 [DOI: 10.1109/RAMS.1998.653583]Publisher
© Institute of Electrical and Electronics Engineers (IEEE)Publication date
1998Notes
This is a conference paper [© IEEE]. It is also available from: http://ieeexplore.ieee.org/ Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.ISBN
078034362XLanguage
- en