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Accelerated testing of performance of thin film module

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conference contribution
posted on 2009-08-10, 10:10 authored by Pongpan Vorasayan, Tom BettsTom Betts, Ralph Gottschalg, A.N. Tiwari
There is an interest in identifying localised effects when investigating durability of devices. The combination of tests might also have an influence on test results. This is investigated for single junction amorphous silicon modules. The modules were put under accelerated testing including thermal cycling, light soaking and annealing test. I-V measurement and LBIC system as characterisation tools are used to investigate the possible degradation occurring in the devices both before and after certain stages of the test. Results have shown that there is a difference between modules which have experienced light soaking before being exposed to thermal cycling, indicating that the initial light soaking resulted in a UV activation of the material, which then changed the durability of the lamination.

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Research Unit

  • Centre for Renewable Energy Systems Technology (CREST)

Citation

VORASAYAN, P. ... et al, 2008. Accelerated testing of performance of thin film module. IN: Hutchins, M. and Pearsall, N. (eds.) . 4th Photovoltaic Science Application and Technology (PVSAT-4) Conference and Exhibition, 2-4 April 2008, University of Bath.

Publisher

PVSAT / © The authors

Version

  • AM (Accepted Manuscript)

Publication date

2008

Notes

This is a conference paper.

ISBN

0904963733

Language

  • en

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