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Kong M.G. and Lee Y.P Jnl of Applied Physics 2001.pdf (270.68 kB)

Impact of surface discharge plasmas on performance of a metallized film capacitor

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journal contribution
posted on 2009-08-19, 14:26 authored by Michael G. Kong, J.P. Lee
Surface breakdown discharges are one probable failure mechanism of metallized polymeric film capacitors used in power systems, traction drives, and other technological applications. To assess whether surface breakdown discharges may undergo considerable elongation on the electrode surface to affect significantly capacitor performance, an equivalent electric circuit model is developed for metallized polymer film capacitors under the thermal equilibrium condition. With the aid of a surface field gradient mechanism, propagation of surface plasmas is studied and the necessary condition for their possible elongation is obtained. Numerical examples of a metallized film capacitor are used to demonstrate that surface breakdown plasmas and their elongation are unlikely to affect capacitor performance in a significant fashion. Then the generic problem of plasma propagation is restudied under thermally nonequilibrium conditions. Based on a heat conduction formulation in the one-dimensional limit, a temperature gradient mechanism is proposed to explain the possible elongation of breakdown plasmas on an electrode surface. Numerical examples are again used to deduce that thermally nonequilibrium surface plasmas are unlikely to evolve into catastrophic flashover arcs to fail film capacitors.

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Citation

KONG, M.G. and LEE, Y.P., 2001. Impact of surface discharge plasmas on performance of a metallized film capacitor. Journal of Applied Physics, 90(6), pp. 3069-3078.

Publisher

© American Institute of Physics

Version

  • VoR (Version of Record)

Publication date

2001

Notes

Copyright 2001 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the authors and the American Institute of Physics. This article appeared in the Journal of Applied Physics and may be found at: http://link.aip.org/link/?JAPIAU/90/3069/1

ISSN

0021-8979

Language

  • en

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