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Efficient protection of the pipeline core for safety-critical processor-based systems
conference contribution
posted on 2010-04-29, 16:13 authored by E. Touloupis, James FlintJames Flint, Vassilios Chouliaras, D.D. WardThe increasing number of safety-critical commercial
applications has generated a need for components with high
levels of reliability. As CMOS process sizes continue to shrink,
the reliability of ICs is negatively affected since they become
more sensitive to transient faults. New circuit designs must take
this fact into consideration, and incorporate adequate protection
against the effects of transient faults. This paper presents a
novel method for protecting the pipelined execution unit of an
embedded processor. It is based on a self-configured architecture
with hybrid redundancy that can mask single and multiple
errors, which can occur on storage elements due to transient
or permanent faults. This concept can be easily applied to any
processing architecture of this nature with a high safety integrity
level. Results from error-injection experiments are also reported
that show that this design can maintain a non-interrupted and
failure-free operation under single and double errors with a
probability that exceeds 99.4%.
History
School
- Mechanical, Electrical and Manufacturing Engineering
Citation
TOULOUPIS, E. .....et al., 2005. Efficient protection of the pipeline core for safety-critical processor-based systems. IN: IEEE Workshop on Signal Processing Systems Design and Implementation, Athens, Nov 2nd-4th, pp. 188 - 192Publisher
© IEEEVersion
- VoR (Version of Record)
Publication date
2005Notes
This is a conference paper [© IEEE]. It is also available at: http://ieeexplore.ieee.org/ Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.ISBN
0780393333ISSN
1520-6130Language
- en