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Accuracy of energy prediction methodologies
conference contribution
posted on 2011-03-11, 10:53 authored by Sheryl WilliamsSheryl Williams, Tom BettsTom Betts, Ralph Gottschalg, David Infield, H. de Moor, N. van der Borg, A.R. Burgess, Gabi Friesen, D. Chianese, Antoine Guerin de Montgareuil, T. Zdanowicz, D. Stellbogen, W. HerrmannIn the current market, the specific annual
energy yield (kWh/kWp) of a PV system is gaining in
importance due to its direct link to the financial returns
for possible investors who typically demand an
accuracy of 5% in this prediction. This paper focuses
on the energy prediction of photovoltaic modules
themselves, as there have been significant advances
achieved with module technologies which affect the
device physics in a way that might force the revisiting
of device modelling.
The paper reports the results of a round robin
based evaluation of European modelling
methodologies. The results indicate that the error in
predicting energy yield for the same module at
different locations was within 5% for most of the
methodologies. However, this error increased
significantly if the nominal nameplate rating is used in
the characterization stage. For similar modules at the
same location the uncertainties were much larger due
to module-module variations.
History
School
- Mechanical, Electrical and Manufacturing Engineering
Research Unit
- Centre for Renewable Energy Systems Technology (CREST)
Citation
WILLIAMS, S.R. ... et al, 2006. Accuracy of energy prediction methodologies. IN: Conference Record of the 4th IEEE World Conference on Photovoltaic Energy Conversion 2006, Vol.2, Hawaii, USA, 7th-12th May, pp. 2206-2209.Publisher
© IEEEVersion
- VoR (Version of Record)
Publication date
2006Notes
This conference paper [© IEEE] is also available at: http://dx.doi.org/10.1109/WCPEC.2006.279946. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.ISBN
1424400163Publisher version
Language
- en
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