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Impact of spectral effects on the electrical parameters of multijunction amorphous silicon cells
conference contribution
posted on 2011-03-15, 15:51 authored by Thomas R. Betts, Christian N. Jardine, Ralph Gottschalg, David Infield, Kevin LaneThe influence of spectral variation on the efficiency
of single-, double- and triple-junction amorphous silicon
cells has been investigated. The average photon energy
(APE) proves to be a useful device-independent
environmental parameter for quantifying the average hue
of incident spectra. Single-junction devices increase in
efficiency as light becomes blue shifted, because more of
the incident spectrum lies within the absorption window
and less in the redlinfra-red tail; this is denoted the
primary spectral effect. Double- and triple-junction
devices also exhibit a secondary spectral effect due to
mismatch between the device structure and the incident
spectrum. These both reach a maximum efficiency, which
drops off as light is red or blue shifted. The effect is more
pronounced for triple-junction than double-junction
devices, as mismatch between junctions is statistically
more likely.
History
School
- Mechanical, Electrical and Manufacturing Engineering
Research Unit
- Centre for Renewable Energy Systems Technology (CREST)
Citation
BETTS, T.R....et al., 2003. Impact of spectral effects on the electrical parameters of multijunction amorphous silicon cells. IN: Proceedings of 3rd World Conference on Photovoltaic Energy Conversion, Osaka, Japan, 11-18 May, 2, pp. 1756-1759Publisher
© IEEEVersion
- VoR (Version of Record)
Publication date
2003Notes
This is a conference paper [© IEEE]. It is also available at: http://ieeexplore.ieee.org/ Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.ISBN
4990181603Publisher version
Language
- en
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