ISFI-D-13-00185-05-04-2014.pdf (364.91 kB)
Research on information systems failures and successes: status update and future directions
journal contribution
posted on 2015-03-06, 14:48 authored by Yogesh K. Dwivedi, David Wastell, Sven Laumer, Helle Zinner Henriksen, Michael D. Myers, Deborah Bunker, Amany Elbanna, M.N. Ravishankar, Shirish C. SrivastavaInformation systems success and failure are among the most prominent streams in IS research. Explanations of why some IS fulfill their expectations, whereas others fail, are complex and multi-factorial. Despite the efforts to understand the underlying factors, the IS failure rate remains stubbornly high. A Panel session was held at the IFIP Working Group 8.6 conference in Bangalore in 2013 which forms the subject of this Special Issue. Its aim was to reflect on the need for new perspectives and research directions, to provide insights and further guidance for managers on factors enabling IS success and avoiding IS failure. Several key issues emerged, such as the need to study problems from multiple perspectives, to move beyond narrow considerations of the IT artifact, and to venture into underexplored organizational contexts, such as the public sector. © 2014 Springer Science+Business Media New York.
History
School
- Business and Economics
Department
- Business
Published in
Information Systems FrontiersCitation
DWIVEDI, Y.K. ... et al, 2015. Research on information systems failures and successes: status update and future directions. Information Systems Frontiers, 17 (1), pp. 143-157.Publisher
© Springer Science+Business MediaVersion
- AM (Accepted Manuscript)
Publisher statement
This work is made available according to the conditions of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0) licence. Full details of this licence are available at: https://creativecommons.org/licenses/by-nc-nd/4.0/Publication date
2015Notes
The final publication is available at Springer via http://dx.doi.org/10.1007/s10796-014-9500-yISSN
1387-3326eISSN
1572-9419Publisher version
Language
- en