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Eco-intelligent monitoring for fouling detection in clean-in-place

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journal contribution
posted on 2016-06-23, 08:57 authored by Alessandro Simeone, Elliot WoolleyElliot Woolley, Alfredo Zendejas Rodriguez, Shahin RahimifardShahin Rahimifard
Clean-in-place (CIP) is a widely used technique applied to clean industrial equipment without disassembly. Cleaning protocols are currently defined arbitrarily from offline measurements. This can lead to excessive resource (water and chemicals) consumption and downtime, further increasing environmental impacts. An optical monitoring system has been developed to assist eco-intelligent CIP process control and improve resource efficiency. The system includes a UV optical fouling monitor designed for real-time image acquisition and processing. The output of the monitoring is such that it can support further intelligent decision support tools for automatic cleaning assessment during CIP phases. This system reduces energy and water consumption, whilst minimising non-productive time: the largest economic cost for CIP.

Funding

This work was funded by the Engineering and Physical Sciences Research Council [grant number EP/I033351/1] as part of the Centre for Innovative Manufacturing in Industrial Sustainability.

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Published in

10th CIRP Conference on Intelligent Computation in Manufacturing Engineering - CIRP ICME '16 Procedia CIRP

Citation

SIMEONE, A. ...et al., 2017. Eco-intelligent monitoring for fouling detection in clean-in-place. Procedia CIRP, 62, pp. 500–505.

Publisher

© The Authors. Published by Elsevier

Version

  • AM (Accepted Manuscript)

Publisher statement

This work is made available according to the conditions of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0) licence. Full details of this licence are available at: https://creativecommons.org/licenses/by-nc-nd/4.0/

Acceptance date

2016-06-08

Publication date

2017

Notes

This paper was presented at the 10th CIRP Conference on Intelligent Computation in Manufacturing Engineering - CIRP ICME '16, Naples.

ISSN

2212-8271

Language

  • en

Location

Naples

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