96_RAMS_FTBDD_RMS&JDA.pdf (670.96 kB)
Fault Tree Analysis and Binary Decision Diagrams
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posted on 2008-09-09, 10:43 authored by Roslyn M. Sinnamon, J.D. AndrewsFault tree analysis is now commonly used to assess the
adequacy, in reliability terms, of industrial systems. For
complex systems an analysis may produce thousands of
combinations of events which can cause system failure
(minimal cut sets). The determination of these minimal cut
sets can be a very time consuming process even on modern high speed digital computers. Also if the fault tree has many
minimal cut sets calculating the exact top event probability
will require extensive calculations. For many complex fault
trees this requirement is beyond the capability of the availaible
machines, thus approximation techiques need to be introduced resulting in loss of accuracy.
This paper describes the use of Binary Descision Diagrams for
Fault Tree Analysis and some ways in which it can be efficiently implimented on a computer. The work to date
shows a substantial improvement in computational effort for
large, complex fault trees analysis with this method in
comparison to the traditional approach. The Binary Decision
Diagram method has the additional advantage that
approximations are not required, exact calculations for the top
event parameters can be performed.
History
School
- Aeronautical, Automotive, Chemical and Materials Engineering
Department
- Aeronautical and Automotive Engineering
Citation
SINNAMON, R.M. and ANDREWS, J.D., 1996. Fault Tree Analysis and Binary Decision Diagrams. IN: Reliability and Maintainability Symposium, 1996 Proceedings : International Symposium on Product Quality and Integrity, Las Vegas, 22-25 January, pp. 215-222 [DOI: 10.1109/RAMS.1996.500665]Publisher
© Institute of Electrical and Electronics Engineers (IEEE)Publication date
1996Notes
This is a conference paper [© IEEE]. It is also available from: http://ieeexplore.ieee.org/ Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.ISBN
0780331125ISSN
0149-144XLanguage
- en