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Applying the random effect negative binomial model to examine traffic accident occurrence at signalized intersections
journal contribution
posted on 2009-09-04, 09:02 authored by Hoong Chor Chin, Mohammed A. QuddusPoisson and negative binomial (NB) models have been used to analyze traffic accident occurrence at intersections for several years. There
are however, limitations in the use of such models. The Poisson model requires the variance-to-mean ratio of the accident data to be about 1.
Both the Poisson and the NB models require the accident data to be uncorrelated in time. Due to unobserved heterogeneity and serial correlation
in the accident data, both models seem to be inappropriate.Amore suitable alternative is the random effect negative binomial (RENB)
model, which by treating the data in a time-series cross-section panel, will be able to deal with the spatial and temporal effects in the data.
This paper describes the use of RENB model to identify the elements that affect intersection safety. To establish the suitability of the
model, several goodness-of-fit statistics are used. The model is then applied to investigate the relationship between accident occurrence and
the geometric, traffic and control characteristics of signalized intersections in Singapore. The results showed that 11 variables significantly
affected the safety at the intersections. The total approach volumes, the numbers of phases per cycle, the uncontrolled left-turn lane and
the presence of a surveillance camera are among the variables that are the highly significant.
History
School
- Architecture, Building and Civil Engineering
Citation
CHIN, H.C. and QUDDUS, M.A., 2003. Applying the random effect negative binomial model to examine traffic accident occurrence at signalized intersections. Accident Analysis and Prevention, 35(2), pp. 253-259Publisher
© ElsevierVersion
- NA (Not Applicable or Unknown)
Publication date
2003Notes
This article is Closed Access. It was published in the journal, Accident Analysis and Prevention [© Elsevier] and is available at: http://dx.doi.org/10.1016/S0001-4575(02)00003-9ISSN
0001-4575Language
- en