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Browsing by Author Dwyer, Vincent M.
Showing results 1 to 20 of 30
| Issue Date | Title | Author(s) | | 2011 | Analysis of critical-length data from electromigration failure studies | Dwyer, Vincent M. |
| 2010 | Analysis of multistate models for electromigration failure | Dwyer, Vincent M. |
| 2004 | An analysis of the weakest-link model for early electromigration failure | Dwyer, Vincent M. |
| 2004 | An analytical model of the microstructure in near-bamboo interconnects | Dwyer, Vincent M. |
| 2018 | Assessing blood vessel perfusion and vital signs through retinal imaging photoplethysmography | Hassan, Harnani; Jaidka, Sheila; Dwyer, Vincent M.; Hu, Sijung |
| 2013 | Bidirectional electromigration failure | Lim, M.K.; Chouliaras, V.A.; Gan, C.L.; Dwyer, Vincent M. |
| 1997 | Classical localization and percolation in random environments on trees | Bressloff, P.C.; Dwyer, Vincent M.; Kearney, Michael J. |
| 2012 | Comment on "Relay selection for secure cooperative networks with jamming" | Chen, Gaojie; Dwyer, Vincent M.; Krikidis, Ioannis; Thompson, J.S.; McLaughlin, S.; Chambers, Jonathon |
| 2012 | Diffusivity variation in electromigration failure | Dwyer, Vincent M. |
| 2015 | A dynamic opto-physiological model to effectively interpret retinal microvascular circulation | Hassan, Harnani; Hu, Sijung; Dwyer, Vincent M. |
| 2001 | Electromigration voiding in nanoindented, single crystal Al lines | Dwyer, Vincent M.; Wan Ismail, W.S. |
| 2018 | Frame registration for motion compensation in imaging photoplethysmography | Iakovlev, Dmitry; Hu, Sijung; Dwyer, Vincent M. |
| 2019 | General approach to quantum mechanics as a statistical theory | Rundle, Russell P.; Tilma, Todd; Samson, J.H.; Dwyer, Vincent M.; Bishop, R.F.; Everitt, Mark J. |
| 2004 | The influence of microstructure on the probability of early failure in aluminum-based interconnects | Dwyer, Vincent M. |
| 2010 | An investigation of electromigration induced void nucleation time statistics in short copper interconnects | Dwyer, Vincent M. |
| 1996 | Localization-delocalization transition for drift diffusion in a random environment | Bressloff, P.C.; Dwyer, Vincent M.; Kearney, Michael J. |
| 2008 | Modeling the electromigration failure time distribution in short copper interconnects | Dwyer, Vincent M. |
| 2016 | Noncontact blood perfusion mapping in clinical applications | Iakovlev, Dmitry; Dwyer, Vincent M.; Hu, Sijung; Silberschmidt, Vadim V. |
| 2017 | Open quantum systems, effective Hamiltonians, and device characterization | Dwyer, Vincent M.; Duffus, Stephen N.A.; Everitt, Mark J. |
| 2006 | Operational reliability calculations for critical systems | Goodall, Roger M.; Dixon, Roger; Dwyer, Vincent M. |
Showing results 1 to 20 of 30
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