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Browsing by Author Dwyer, Vincent M.

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Showing results 1 to 15 of 15
Issue DateTitleAuthor(s)
2011Analysis of critical-length data from electromigration failure studiesDwyer, Vincent M.
2010Analysis of multistate models for electromigration failureDwyer, Vincent M.
2004An analysis of the weakest-link model for early electromigration failureDwyer, Vincent M.
2004An analytical model of the microstructure in near-bamboo interconnectsDwyer, Vincent M.
1997Classical localization and percolation in random environments on treesBressloff, P.C.; Dwyer, Vincent M.; Kearney, Michael J.
2012Diffusivity variation in electromigration failureDwyer, Vincent M.
2001Electromigration voiding in nanoindented, single crystal Al linesDwyer, Vincent M.; Wan Ismail, W.S.
2004The influence of microstructure on the probability of early failure in aluminum-based interconnectsDwyer, Vincent M.
2010An investigation of electromigration induced void nucleation time statistics in short copper interconnectsDwyer, Vincent M.
1996Localization-delocalization transition for drift diffusion in a random environmentBressloff, P.C.; Dwyer, Vincent M.; Kearney, Michael J.
2008Modeling the electromigration failure time distribution in short copper interconnectsDwyer, Vincent M.
2006Operational reliability calculations for critical systemsGoodall, Roger M.; Dixon, Roger; Dwyer, Vincent M.
1993Quantitative analysis in low-energy-electron transmission and reflection spectroscopyDwyer, Vincent M.
2012Reliability of 2-out-of-N:G systems with NHPP failure flows and fixed repair timesDwyer, Vincent M.; Goodall, Roger M.; Dixon, Roger
2012Reliability of various 2-out-of-4:G redundant systems with minimal repairDwyer, Vincent M.
Showing results 1 to 15 of 15