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Browsing by Author Dwyer, Vincent M.

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Issue DateTitleAuthor(s)
2004The influence of microstructure on the probability of early failure in aluminum-based interconnectsDwyer, Vincent M.
2010An investigation of electromigration induced void nucleation time statistics in short copper interconnectsDwyer, Vincent M.
1996Localization-delocalization transition for drift diffusion in a random environmentBressloff, P.C.; Dwyer, Vincent M.; Kearney, Michael J.
2008Modeling the electromigration failure time distribution in short copper interconnectsDwyer, Vincent M.
2006Operational reliability calculations for critical systemsGoodall, Roger M.; Dixon, Roger; Dwyer, Vincent M.
1993Quantitative analysis in low-energy-electron transmission and reflection spectroscopyDwyer, Vincent M.
2016Quantum systems engineering: a structured approach to accelerating the development of a quantum technology industryEveritt, Mark J.; Henshaw, Michael; Dwyer, Vincent M.
2012Reliability of 2-out-of-N:G systems with NHPP failure flows and fixed repair timesDwyer, Vincent M.; Goodall, Roger M.; Dixon, Roger
2012Reliability of various 2-out-of-4:G redundant systems with minimal repairDwyer, Vincent M.
2016Some implications of superconducting quantum interference to the application of master equations in engineering quantum technologiesDuffus, Stephen; Bjergstrom, Keiran N.; Dwyer, Vincent M.; Samson, J.H.; Spiller, T.P.; Zagoskin, Alexandre M.; Munro, W.J.; Nemoto, Kae; Everitt, Mark J.
2016Towards a UK co-operative for the advancement of quantum technologyBjergstrom, Keiran N.; Cross, Trevor; Dwyer, Vincent M.; Everitt, Mark J.; Henshaw, Michael; John, Paul; Lemon, Jack; Lobo, Leon M.; Murray, Richard; Paul, Doug; Pritchard, Jonathan; Ralph, J.F.; Till, Stephen; Wrigley, Craig
2016VThreads: A novel VLIW chip multiprocessor with hardware-assisted PThreadsChouliaras, V.A.; Stevens, David; Dwyer, Vincent M.
Showing results 11 to 22 of 22