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Title: Noninvasive imaging of signals in digital circuits
Authors: Gebrial, W.
Prance, R.J.
Clark, T.D.
Harland, C.J.
Prance, H.
Everitt, Mark J.
Issue Date: 2002
Publisher: © American Institute of Physics
Citation: GEBRIAL, W. ... et al., 2002. Noninvasive imaging of signals in digital circuits. Review of Scientific Instruments, 73 (3), pp. 1293 - 1298.
Abstract: In this article we describe the construction and use of a noninvasive (noncontact) electric potential probe to measure time delays of signals propagating through digital circuits. As we show, by incorporating such probes into a scanning microscope system we have been able to create time delay images of these signals.We suggest that future developments of this technique may lead to real time, high resolution imaging of digital pulses across complex very large scale integrated circuits.
Description: This article was published in the Review of Scientific Instruments [© American Institute of Physics] and the definitive version is available at: http://dx.doi.org/10.1063/1.1447302
Version: Published
DOI: 10.1063/1.1447302
URI: https://dspace.lboro.ac.uk/2134/12071
Publisher Link: http://dx.doi.org/10.1063/1.1447302
ISSN: 0034-6748
Appears in Collections:Published Articles (Physics)

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