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Please use this identifier to cite or link to this item: https://dspace.lboro.ac.uk/2134/13242

Title: Single-shot profilometry of rough surfaces using hyperspectral interferometry
Authors: Widjanarko, Taufiq
Huntley, Jonathan M.
Ruiz, Pablo D.
Issue Date: 2012
Publisher: © Optical Society of America
Citation: WIDJANARKO, T., HUNTLEY, J.M. and RUIZ, P.D., 2012. Single-shot profilometry of rough surfaces using hyperspectral interferometry. Optics Letters, 37 (3), pp. 350 - 352.
Abstract: The combination of white light interferometry with hyperspectral imaging (“hyperspectral interferometry”) is a recently proposed technique for single-shot measurement of 3D surface profiles. We consider for the first time its application to speckled wavefronts from optically rough surfaces. The intensity versus wavenumber signal at each pixel provides unambiguous range information despite the speckle-induced random phase shifts. Experimental results with samples undergoing controlled rigid body translation demonstrate a measurement repeatability of 460 nm for a bandwidth of approximately 30 nm. Potential applications include roughness measurement and coordinate measurement machine probes where rapid data acquisition in noncooperative environments is essential.
Description: This paper was published in Optics Letters and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/ol/abstract.cfm?uri=ol-37-3-350 Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
Version: Published
DOI: 10.1364/OL.37.000350
URI: https://dspace.lboro.ac.uk/2134/13242
Publisher Link: http://dx.doi.org/10.1364/OL.37.000350
ISSN: 0146-9592
Appears in Collections:Published Articles (Mechanical, Electrical and Manufacturing Engineering)

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