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Title: Hyperspectral interferometry for single-shot absolute measurement of two-dimensional optical path distributions
Authors: Huntley, Jonathan M.
Widjanarko, Taufiq
Ruiz, Pablo D.
Keywords: Interferometry
Phase unwrapping
Shape measurement
Profilometry
Absolute distance measurement
Optical coherence tomography
Issue Date: 2010
Publisher: © IOP Publishing Ltd
Citation: HUNTLEY, J.M., WIDJANARKO, T. and RUIZ, P.D., 2010. Hyperspectral interferometry for single-shot absolute measurement of two-dimensional optical path distributions. Measurement Science and Technology, 21 (7), 075304
Abstract: We propose a method that we call hyperspectral interferometry (HSI) to resolve the 2π phase unwrapping problem in the analysis of interferograms recorded with a narrow-band light source. By using a broadband light source and a hyperspectral imaging system, a set of interferograms at different wave numbers are recorded simultaneously on a high resolution image sensor. These are then assembled to form a three-dimensional intensity distribution. By Fourier transformation along the wave number axis, an absolute optical path difference is obtained for each pixel independently of the other pixels in the field of view. As a result, interferograms with spatially distinct regions are analysed as easily as continuous ones. The approach is illustrated with a HSI system to measure 3D profiles of optically smooth or rough surfaces. Compared to existing profilometers able to measure absolute path differences, the single-shot nature of the approach provides greater immunity from environmental disturbance.
Description: This article was published in the journal, Measurement Science and Technology [© IOP Publishing Ltd]. The definitive version is available at: http://dx.doi.org/10.1088/0957-0233/21/7/075304
Version: Accepted for publication
DOI: 10.1088/0957-0233/21/7/075304
URI: https://dspace.lboro.ac.uk/2134/13315
Publisher Link: http://dx.doi.org/10.1088/0957-0233/21/7/075304
ISSN: 0957-0233
Appears in Collections:Published Articles (Mechanical, Electrical and Manufacturing Engineering)

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