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Degradation study of the peel strength of mini-modules under damp heat condition

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posted on 2014-02-26, 11:46 authored by Dan Wu, Jiang Zhu, Thomas R. Betts, Ralph Gottschalg
This paper presents the degradation study results of adhesion strength between backsheet and encapsulant for a commercial minimodule. A degradation model for the adhesion strength is developed and the activation energy is obtained. Outdoor prediction example is given based on environmental data in Loughborough and Denver

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Research Unit

  • Centre for Renewable Energy Systems Technology (CREST)

Citation

WU, D. ... et al., 2013. Degradation study of the peel strength of mini-modules under damp heat condition. Poster presented at the National Renewable Energy Laboratory (NREL) PV Module Reliability Workshop (PVMR), 2013.

Version

  • AM (Accepted Manuscript)

Publication date

2013

Notes

Poster presented at the NREL PVMR, 2013.

Language

  • en

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