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Title: The use of combined three-dimensional electron backscatter diffraction and energy dispersive X-ray analysis to assess the characteristics of the gamma/gamma-prime microstructure in alloy 720Li (TM)
Authors: Child, Daniel
West, G.D.
Thomson, Rachel C.
Keywords: Electron backscatter diffraction (EBSD)
Energy dispersive x-ray analysis (EDX)
3D reconstruction
Gamma-gamma prime
Phase connectivity
Grain banding
Issue Date: 2012
Publisher: © Elsevier B.V.
Citation: CHILD, D., WEST, G.D. and THOMSON, R.C., 2012. The use of combined three-dimensional electron backscatter diffraction and energy dispersive X-ray analysis to assess the characteristics of the gamma/gamma-prime microstructure in alloy 720Li (TM). Ultramicroscopy, 114, pp. 1 - 10.
Abstract: Multiple three-dimensional reconstructions of a γ/γ′ phase structure in Alloy 720Li have been carried out by employing a serial milling technique with simultaneous electron backscatter diffraction (EBSD) and energy dispersive x-ray (EDX) analysis data collection. Combining EBSD data with EDX is critical in obtaining maps to distinguish between the chemically differing, but crystallographically similar γ and γ′ phases present in the alloy studied. EDX is shown to allow the differentiation of γ and γ′ phases, with EBSD providing increased grain shape accuracy. The combination of data sources also allowed identification of coherent γ/γ′ phase interfaces that would not be identified using solely EBSD or EDX. The study identifies a region of grain banding within the alloy, which provides the basis for a three-dimensional comparison and discussion of γ′ phase size between coarse and fine grain regions, whilst also identifying coherent γ′ phase interfaces, possible only using both EDX and EBSD systems simultaneously. The majority of the γ′ phase lies in the range of 1–10 μm in non-banded regions, with a detectable particle size limit of 500 nm being established. The validity of the reconstruction has been demonstrated using an electron interaction volumes model, and an assessment of the validity of EBSD and EDX data sources is discussed showing γ′ phase connectivity in all dimensions.
Description: This is the author’s version of a work that was accepted for publication in Ultramicroscopy. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Ultramicroscopy, vol 114, pp. 1-10, 2012, DOI: 10.1016/j.ultramic.2011.11.003
Version: Accepted for publication
DOI: 10.1016/j.ultramic.2011.11.003
URI: https://dspace.lboro.ac.uk/2134/15326
Publisher Link: http://dx.doi.org/10.1016/j.ultramic.2011.11.003
ISSN: 0304-3991
Appears in Collections:Published Articles (Materials)

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