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|Title: ||Assessment of surface hardening effects from shot peening on a Ni-based alloy using electron backscatter diffraction techniques|
|Authors: ||Child, Daniel|
Thomson, Rachel C.
|Keywords: ||Electron backscatter diffraction (EBSD)|
|Issue Date: ||2011|
|Publisher: ||Elsevier Ltd / © Acta Materialia Inc.|
|Citation: ||CHILD, D., WEST, G.D. and THOMSON, R.C., 2011. Assessment of surface hardening effects from shot peening on a Ni-based alloy using electron backscatter diffraction techniques. Acta Materialia, 59 (12), pp. 4825 - 4834.|
|Abstract: ||An electron backscatter diffraction (EBSD)-based tool is described to assess the depth of strain-hardening effects of shot-peening treatments applied to the Ni-based superalloy, Udimet© alloy 720Li. The method consists of a statistical analysis of a number of data points from each grain scanned based on the grain orientation spread and their relative position from the shot-peened edge. The output is a quantitative measure of the depth of strain-hardening effects. The tool is used at various shot-peening intensities to demonstrate the ability to distinguish between these changes, using a range of intensities from 4 to 10 Almen. An increase in shot-peening intensity is observed to increase the depth of strain-hardening effects in the alloy. A comparison with residual stress measurements using X-ray diffraction for the same material shows that the strain-hardened depth determined by EBSD extends to approximately half the distance of the residual stress present due to shot peening. A comparison is also made with predicted profiles from the PeenstressSM model and subsequent microhardness testing. A positive correlation is observed between strained hardened depth and surface roughness of the peened samples. In each case, the increases in surface roughness and strain-hardened depth diminish toward the upper end of the shot-peening intensity range studied for this alloy.|
|Description: ||This is the author’s version of a work that was accepted for publication in Acta Materialia. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Acta Materialia, vol 59, pt. 12, pp. 4825-4834, 2011, DOI: 10.1016/j.actamat.2011.04.025|
|Version: ||Submitted for publication|
|Publisher Link: ||http://dx.doi.org/10.1016/j.actamat.2011.04.025|
|Appears in Collections:||Published Articles (Materials)|
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