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Please use this identifier to cite or link to this item: https://dspace.lboro.ac.uk/2134/15550

Title: Robust intelligent metrology
Authors: Petzing, Jon N.
Tailor, Mitul
Kinnell, Peter
Keywords: Engineering
Metrology
Issue Date: 2014
Publisher: Royal Academy of Engineering
Citation: PETZING, J.N., TAILOR, M. and KINNELL, P., 2014. Robust intelligent metrology. IN: Williams, R (ed). Royal Academy of Engineering Soiree and Exhibition 2014: Manufacturing - at the heart of the nation, 19th June 2014, The MTC, Coventry, pp.21.
Abstract: Robust Intelligent Metrology considers how to maintain, develop, streamline and apply core metrological principles within rapidly evolving measurement scenarios and environments. The aim is to deliver metrology laboratory quality measurements and data confidence, but with equipment integrated into operating High Value Manufacturing cells. Key challenges are to understand; transducer / surface interactions, data processing and integrity, in-cell calibration / traceability. The end result is to provide engineers with quicker, better data.
Description: This is a conference contribution.
Version: Accepted for publication
URI: https://dspace.lboro.ac.uk/2134/15550
Appears in Collections:Conference Papers and Contributions (Mechanical, Electrical and Manufacturing Engineering)

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