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Please use this identifier to cite or link to this item: https://dspace.lboro.ac.uk/2134/15847

Title: Review of uncertainty sources in indoor PV calibration of c-SI, and thin film single junction and multi junction cells and modules
Authors: Mihaylov, Blagovest V.
Bliss, Martin
Betts, Thomas R.
Gottschalg, Ralph
Issue Date: 2013
Publisher: © Solar Energy Society and PV-Net UK
Citation: MIHAYLOV, B.V. ... et al, 2013. Review of uncertainty sources in indoor PV calibration of c-SI, and thin film single junction and multi junction cells and modules. IN: Hutchins, M., Cole, A. and Watson, T. (eds.). Conference Proceedings C95: 9th Photovoltaic Science, Applications and Technology Conference, PVSAT-9, Swansea University,Swansea, Wales, 10th-12th April. Abingdon : Solar Energy Society, pp.179-182.
Abstract: The calibration of PV devices requires an uncertainty analysis. However, the benefits of such analysis are not limited to calibration procedures. It can be useful for all PV device measurements since it increases the validity of the results. The sources of uncertainty in indoor PV device calibration are outlined. The uncertainties are discussed for different measurement setups and technologies. Indoor secondary calibration uncertainty in Pmax can range from less than 1.5% for c-Si cells to more than 10% for large TF modules. The paper highlights the importance of understanding the uncertainty sources and conducting specific uncertainty calculations for a given measurement setup. The implications for research laboratories are that excessively large uncertainty in measurements can make comparison between results misleading and the conclusions questionable.
Description: This is a conference paper.
Version: Accepted for publication
URI: https://dspace.lboro.ac.uk/2134/15847
Publisher Link: http://www.pvsat.org.uk/PVSAT-9_Proceedings-FINAL.pdf
Appears in Collections:Conference Papers and Presentations (Mechanical, Electrical and Manufacturing Engineering)
Conference Papers and Contributions (CREST)

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