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Please use this identifier to cite or link to this item: https://dspace.lboro.ac.uk/2134/16737

Title: Depth-resolved phase imaging
Authors: Huntley, Jonathan M.
Ruiz, Pablo D.
Editors: Espinosa, H.D.
Hild, F.
Keywords: Phase imaging
Phase unwrapping
Speckle interferometry
Optical Coherence Tomography
Issue Date: 2012
Publisher: © Elsevier B.V.
Citation: HUNTLEY, J.M. and RUIZ, P.D., 2012. Depth-resolved phase imaging. Procedia IUTAM, 4 pp. 82 - 91.
Abstract: Traditional full-field interferometric techniques (speckle, moiré, holography etc) encode the surface deformation state of the object under test in the form of 2-D phase images. Over the past 10 years, a family of related techniques (Wavelength Scanning Interferometry, Phase Contrast Spectral Optical Coherence Tomography (OCT), Tilt Scanning Interferometry and Hyperspectral Interferometry) has emerged that allows one to measure the volume deformation state within weakly-scattering objects. The techniques can be thought of as combining the phase-sensing capabilities of Phase Shifting Interferometry and the depth-sensing capabilities of OCT. This paper provides an overview of the techniques, and describes a theoretical framework based on the Ewald sphere construction that allows key parameters such as depth resolution and displacement sensitivity to be calculated straightforwardly for any given optical geometry and wavelength scan range. Finally, the related issue of robust phase unwrapping of noisy 3-D wrapped phase volumes is also described.
Description: This is an article from a special issue of the serial, Procedia IUTAM with papers from the IUTAM Symposium on Full-field Measurements and Identification in Solid Mechanics. The issue is published by Elsevier as open access under a CC-BY-NC-ND 3.0 licence.
Sponsor: The work was supported in part by the Engineering and Physical Sciences Research Council, and by the Royal Society.
Version: Published
DOI: 10.1016/j.piutam.2012.05.010
URI: https://dspace.lboro.ac.uk/2134/16737
Publisher Link: http://dx.doi.org/10.1016/j.piutam.2012.05.010
ISSN: 2210-9838
Appears in Collections:Published Articles (Mechanical, Electrical and Manufacturing Engineering)

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