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|Title: ||Use of laser beam diffraction for non-invasive characterisation of CdTe thin film growth structure|
|Authors: ||Goffin, Nicholas J.|
Tyrer, John R.
|Issue Date: ||2015|
|Publisher: ||© 2015 The Authors. Published by Elsevier|
|Citation: ||GOFFIN, N.J. ... et al., 2015. Use of laser beam diffraction for non-invasive characterisation of CdTe thin film growth structure. Procedia CIRP 37, pp. 101-106.|
|Abstract: ||Characterisation of Cadmium Telluride (CdTe) thin films commonly requires the use of invasive techniques for the identification of their structural growth and the detection of defects which occur during the deposition process. Structural growth and the presence of defects can affect the performance of the final device. A non-invasive inspection system for CdTe films has been developed to identify the structural properties of this material, comparing two different deposition techniques, Close Space Sublimation (CSS) and Magnetron Sputtering (MS). The proposed system utilises a 1 μm diode laser which passes through the CdTe layer, originating detectable diffraction patterns, which are characterised using image processing techniques and assessed using a neural network-based cognitive decision-making support system. Results are found to be consistent with the conventional microscopic techniques (SEM and TEM) used to analyse morphological and structural properties of thin-film CdTe solar cells.|
|Description: ||This is an Open Access Article. It is published by Elsevier under the Creative Commons Attribution 4.0 Unported Licence (CC BY). Full details of this licence are available at: http://creativecommons.org/licenses/by/4.0/ The paper was also presented at CIRPe 2015 - Understanding the life cycle implications of manufacturing, 29th Sept- 1st Oct, 2015.|
|Sponsor: ||This research has been funded by the Engineering and Physical Sciences Research Council (EPSRC) in the UK, with project number EP/M014088/1,|
|Publisher Link: ||http://dx.doi.org/10.1016/j.procir.2015.08.077|
|Appears in Collections:||Published Articles (Mechanical, Electrical and Manufacturing Engineering)|
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