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Title: Effect of varying process parameters on CdTe thin film device performance and its relationship to film microstructure
Authors: Munshi, Amit
Abbas, Ali
Raguse, John
Barth, Kurt L.
Sampath, Walajabad S.
Walls, Michael
Keywords: Cadmium Chloride
Cadmium Telluride
Closed Space Sublimation
Photovoltaics
Solar Cell
Thin Film Closed Space Sublimation
Issue Date: 2014
Publisher: © IEEE
Citation: MUNSHI, A. ...et al., 2014. Effect of varying process parameters on CdTe thin film device performance and its relationship to film microstructure. Presented at the 40th IEEE Photovoltaic Specialists Conference (PVSC), Denver, CO, 2014, pp. 1643-1648.
Abstract: The performance of CdTe thin film photovoltaic devices are sensitive to process parameters. In this study, efforts are made to further understand the effects of process parameters like process temperature and variation in cadmium chloride passivation treatment on CdTe films deposited using a sublimation based deposition system. The effects on film microstructure are studied using advanced microstructural characterization methods like TEM, SEM, EDS and SIMS while electrical performance is studied using various electrical measurements such as current density vs. voltage and electroluminescence. The aim of this study is to provide new insight into the understanding of relationship between fabrication process, device performance and thin film microstructure.
Description: Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Sponsor: The research is carried out at Colorado State University is supported by NSF I/UCRC for Next Generation Photovoltaics.
Version: Accepted for publication
DOI: 10.1109/PVSC.2014.6925235
URI: https://dspace.lboro.ac.uk/2134/20610
Publisher Link: http://dx.doi.org/10.1109/PVSC.2014.6925235
Appears in Collections:Published Articles (Mechanical, Electrical and Manufacturing Engineering)

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