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|Title: ||The effect of Cadmium Chloride treatment on close spaced sublimated Cadmium Telluride thin film solar cells|
|Authors: ||Abbas, Ali|
Bowers, Jake W.
Isherwood, Patrick J.M.
Kaminski, Piotr M.
Sampath, Walajabad S.
Barth, Kurt L.
Thin film photovoltaics
Close Space Sublimation
|Issue Date: ||2013|
|Publisher: ||© IEEE|
|Citation: ||ABBAS, A. ...et al., 2013. The effect of Cadmium Chloride treatment on close spaced sublimated Cadmium Telluride thin film solar cells.IEEE 38TH Photovoltaic Specialists Conference (PVSC), Austin, TX, 3-8th June, Vol. 2, pp1-6.|
|Abstract: ||The aim of this investigation is to apply advanced microstructural characterization techniques to study the effect of the cadmium chloride treatment on the physical properties of cadmium telluride solar cells deposited via close-spaced sublimation (CSS) and relate these to cell performance. A range of techniques have been used to observe the microstructural changes as well as the chemical changes before and after cadmium chloride treatment. Electrical measurements that link the device performance with the microstructural properties of the cells have also been undertaken. Transmission Electron Microscopy (TEM) has revealed high densities of stacking faults in the as-grown CdTe samples. Further, it has been observed that these stacking faults are removed during the cadmium chloride treatment. These observations show that the presence of chlorine plays an important role in the removal of these defects and the subsequent production of high efficiency thin film CdTe solar cells. Elemental analysis in the TEM indicates chlorine rich regions appearing at the CdTe/CdS interface as well as at grain boundaries after the treatment.|
|Description: ||Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.|
|Sponsor: ||The authors are grateful to EPSRC and TSB for funding (Loughborough University) and to the NSF I/UCRC and AIR programs (Colorado State University).|
|Version: ||Accepted for publication|
|Publisher Link: ||http://dx.doi.org/10.1109/PVSC-Vol2.2012.6656778|
|Appears in Collections:||Published Articles (Mechanical, Electrical and Manufacturing Engineering)|
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