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Please use this identifier to cite or link to this item: https://dspace.lboro.ac.uk/2134/24772

Title: Single-shot areal profilometry using hyperspectral interferometry with a microlens array
Authors: Ruiz, Pablo D.
Huntley, Jonathan M.
Issue Date: 2017
Publisher: © 2016 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.
Citation: RUIZ, P.D. and HUNTLEY, J.M., 2017. Single-shot areal profilometry using hyperspectral interferometry with a microlens array. Optics Express, 25(8), pp. 8801-8815.
Abstract: We describe a single-shot technique to measure areal profiles on optically smooth and stepped surfaces for applications where rapid data acquisition in non-cooperative environments is essential. It is based on hyperspectral interferometry (HSI), a technique in which the output of a white-light interferometer provides the input to a hyperspectral imaging system. Previous HSI implementations suffered from inefficient utilisation of the available pixels which limited the number of measured coordinates and/or unambiguous depth range. In the current paper a >20-fold increase in pixel utilisation is achieved through the use of a 2-D microlens array, that leads to a 35×35 channel system with an unambiguous depth range of 0.88 mm.
Description: This paper was accepted for publication in the journal Optics Express and the definitive published version is available at https://doi.org/10.1364/OE.25.008801
Sponsor: This research was finded by the Royal Society (Industry Fellowship IF2012/R2) and the Engineering and Physical Sciences Research Council (EP/K018124/1).
Version: Accepted for publication
DOI: 10.1364/OE.25.008801
URI: https://dspace.lboro.ac.uk/2134/24772
Publisher Link: https://doi.org/10.1364/OE.25.008801
ISSN: 1094-4087
Appears in Collections:Published Articles (Mechanical, Electrical and Manufacturing Engineering)

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