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Please use this identifier to cite or link to this item: https://dspace.lboro.ac.uk/2134/25344

Title: Evaluation of effective carrier lifetime of CdTe solar cells using transient photovoltage decay measurements
Authors: Tsai, Vincent
Koutsourakis, George
Bliss, Martin
Betts, Thomas R.
Gottschalg, Ralph
Issue Date: 2017
Publisher: © The Solar Energy Society
Citation: TSAI, V. ... et al, 2017. Evaluation of effective carrier lifetime of CdTe solar cells using transient photovoltage decay measurements. 13th Photovoltaic Science, Application and Technology Conference (PVSAT-13), Bangor, UK, 5th-7th April 2017.
Abstract: A transient photovoltage decay (TPVD) measurement system is currently being developed at CREST and measurements were conducted on several CdTe solar cells. The extracted effective carrier lifetimes were around 100ns. The effect of external illumination biasing was investigated and was found to reduce the effect of junction capacitance and saturate trap states in the devices. This resulted in shorter extracted effective carrier lifetimes. Increasing the illumination of the pulsed-laser intensity also increased the effective carrier lifetime.
Description: This is a conference paper.
Version: Accepted for publication
URI: https://dspace.lboro.ac.uk/2134/25344
Publisher Link: http://www.pvsat.org.uk/
Appears in Collections:Conference Papers and Presentations (Mechanical, Electrical and Manufacturing Engineering)

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