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Title: On the assessment by grazing-incidence small-angle X-ray scattering of replica quality in polymer gratings fabricated by nanoimprint lithography
Authors: Soccio, M.
Alayo, N.
Martin-Fabiani, Ignacio
Rueda, Daniel R.
Garcia-Gutierrez, Mari-Cruz
Rebollar, Esther
Martinez-Tong, D.E.
Perez-Murano, F.
Ezquerra, Tiberio A.
Issue Date: 2014
Publisher: © International Union of Crystallography
Citation: SOCCIO, M. ... et al., 2014. On the assessment by grazing-incidence small-angle X-ray scattering of replica quality in polymer gratings fabricated by nanoimprint lithography. Journal of Applied Crystallography, 47 (2), pp. 613 - 618.
Abstract: Grazing-incidence small-angle X-ray scattering (GISAXS) can be used to characterize the replica quality of polymer gratings prepared by thermal nanoimprint lithography (NIL). Here it is shown using GISAXS experiments that a series of NIL polymer gratings with different line quality present characteristic features that can be associated with the level of defects per line. Both stamps and NIL polymer gratings exhibit characteristic semicircle-like GISAXS patterns. However NIL polymer gratings with defective lines exhibit GISAXS patterns with an excess of diffuse scattering as compared to those of the corresponding stamps. In a first approach, this effect is attributed to a reduction of the effective length of the lines diffracting coherently as the number of defects per line increases.
Description: This article was published in the Journal of Applied Crystallography [© International Union of Crystallography] and the definitive version is available at: https://doi.org/10.1107/S160057671400168X
Sponsor: The financial support of MICINN through CTQ2010-15680 MAT2011-23455 and MAT2012-33517 is gratefully acknowledged. E.R. and I. M-F. thank MICINN, Spain, for a “Ramón y Cajal ” contract (RYC-2011-08069) and for a FPI fellowship respectively. M.S. and D.-T thank CSIC for the tenure of JAE fellowships and the Fondo Social Europeo (FSE) for co-financing the JAE program. We are indebted to J. Perlich for outstanding beamline support.
Version: Accepted for publication
DOI: 10.1107/S160057671400168X
URI: https://dspace.lboro.ac.uk/2134/26699
Publisher Link: http://dx.doi.org/10.1107/S160057671400168X
ISSN: 0021-8898
Appears in Collections:Published Articles (Materials)

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