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Title: Erratum: "The role of defects in the electrical properties of NbO2 thin film vertical devices" [AIP Advances 6, 125006 (2016)]
Authors: Joshi, Toyanath
Borisov, Pavel
Lederman, David
Issue Date: 2017
Publisher: AIP Publishing © Author(s)
Citation: JOSHI, T., BORISOV, P. and LEDERMAN, D., 2017. Erratum: "The role of defects in the electrical properties of NbO2 thin film vertical devices" [AIP Advances 6, 125006 (2016)]. AIP Advances, 7 (1), 019901.
Abstract: We noticed that Figures 1, 2, and 4(a) in the original publication were of poor quality due to formatting issues. This erratum provides corrected versions of those figures. The original results and discussions were not affected. RHEED images in the inset to the Fig. 1 are now fully visible. Figure 2 shows now properly fitted frames for the AFM image with the correctly placed height scales. Figure 4(a) shows now a correctly presented block diagram for the effective measurement circuit.
Description: This is an Open Access Article. It is published by AIP Publishing under the Creative Commons Attribution 4.0 International Licence (CC BY). Full details of this licence are available at: http://creativecommons.org/licenses/by/4.0/
Version: Published
DOI: 10.1063/1.4974747
URI: https://dspace.lboro.ac.uk/2134/26907
Publisher Link: https://doi.org/10.1063/1.4974747
Appears in Collections:Published Articles (Physics)

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