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Title: STEM EBIC mapping of the metal-insulator transition in thin-film NbO2
Authors: Hubbard, William A.
Joshi, Toyanath
Mecklenburg, Matthew
Zutter, Brian
Borisov, Pavel
Lederman, David
Regan, B.C.
Issue Date: 2017
Publisher: Cambridge University Press © Microscopy Society of America
Citation: HUBBARD, W.A. ... et al, 2017. STEM EBIC mapping of the metal-insulator transition in thin-film NbO2. Microscopy and Microanalysis, 23 (S1), pp. 1428-1429.
Description: This article has been published in a revised form in Microscopy and Microanalysis https://doi.org/10.1017/S1431927617007802. This version is free to view and download for private research and study only. Not for re-distribution, re-sale or use in derivative works. © copyright holder.
Version: Accepted for publication
DOI: 10.1017/S1431927617007802
URI: https://dspace.lboro.ac.uk/2134/26911
Publisher Link: https://doi.org/10.1017/S1431927617007802
ISSN: 1431-9276
Appears in Collections:Published Articles (Physics)

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