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| Title: | STEM EBIC mapping of the metal-insulator transition in thin-film NbO2 |
| Authors: | Hubbard, William A.
Joshi, Toyanath
Mecklenburg, Matthew
Zutter, Brian
Borisov, Pavel
Lederman, David
Regan, B.C. |
| Issue Date: | 2017 |
| Publisher: | Cambridge University Press © Microscopy Society of America |
| Citation: | HUBBARD, W.A. ... et al, 2017. STEM EBIC mapping of the metal-insulator transition in thin-film NbO2. Microscopy and Microanalysis, 23 (S1), pp. 1428-1429. |
| Description: | This article has been published in a revised form in Microscopy and Microanalysis https://doi.org/10.1017/S1431927617007802. This version is free to view and download for private research and study only. Not for re-distribution, re-sale or use in derivative works. © copyright holder. |
| Version: | Accepted for publication |
| DOI: | 10.1017/S1431927617007802 |
| URI: | https://dspace.lboro.ac.uk/2134/26911 |
| Publisher Link: | https://doi.org/10.1017/S1431927617007802 |
| ISSN: | 1431-9276 |
| Appears in Collections: | Published Articles (Physics)
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