This Thesis is concerned with the establishment of a Database for electronic
component reliability data.
Previous research on the reliability of electronic components has mostly
originated from accelerated life test studies. However, this Database contains
information on field failure data. In addition, the Database was designed
specifically for the purpose of exploration of the data in order to establish the
potential factors which may contribute to the reliability of electronic components. [Continues.]
A Doctoral Thesis. Submitted in partial fulfilment of the requirements for the award of Doctor of Philosophy at Loughborough University.