Low energy ion bombardment is a process used in surface analysis and in
the electronics and telecommunications industries. Techniques such as Auger
Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS) and
Secondary Ion Mass Spectroscopy (SIMS) employ ion bombardment for surface
cleaning and for the provision of composition-depth profiles. [Continues.]
A Doctoral Thesis. Submitted in partial fulfilment of the requirements for the award of Doctor of Philosophy at Loughborough University.