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Title: Determination of mode I and II adhesion toughness of monolayer thin films by circular blister tests
Authors: Harvey, Christopher M.
Wang, Simon
Yuan, Bo
Thomson, Rachel C.
Critchlow, Gary W.
Keywords: Adhesion toughness
Circular blisters
Energy release rate
Interface fracture
Thin films
Issue Date: 2018
Publisher: © Elsevier
Citation: HARVEY, C.M., 2018. Determination of mode I and II adhesion toughness of monolayer thin films by circular blister tests. Theoretical and Applied Fracture Mechanics, doi: 10.1016/j.tafmec.2018.01.006.
Abstract: Mechanical models are developed to determine the mode I and II adhesion toughness of monolayer thin films using circular blister tests under either pressure load or point load. The interface fracture of monolayer thin film blisters is mode I dominant for linear bending with small deflection while it is mode II dominant for membrane stretching with large deflection. By taking the advantage of the large mode mixity difference between these two limiting cases, the mode I and II adhesion toughness are determined in conjunction with a linear failure criterion. Thin films under membrane stretching have larger adhesion toughness than thicker films under bending. Experimental results demonstrate the validity of the method.
Description: This paper is in closed access until 6th January 2019.
Version: Accepted for publication
DOI: 10.1016/j.tafmec.2018.01.006
URI: https://dspace.lboro.ac.uk/2134/28040
Publisher Link: https://doi.org/10.1016/j.tafmec.2018.01.006
ISSN: 0167-8442
Appears in Collections:Closed Access (Materials)

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