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Title: Electron and ion kinetics in a DC microplasma at atmospheric pressure
Authors: Iza, Felipe
Lee, Jae Koo
Ryu, Chang-Mo
Keywords: Atmospheric-pressure glow discharge (APGD)
Kinetic simulation
Microdischarge
Microplasma
Issue Date: 2007
Publisher: © IEEE
Citation: IZA, F., LEE, J.K. and RYU, C.-M., 2007. Electron and ion kinetics in a DC microplasma at atmospheric pressure. IEEE transactions on plasma science, 35 (5), pp. 1274-1278
Abstract: The results of a particle-in-cell Monte Carlo collision (PIC-MCC) simulation of a direct current (dc) helium microplasma that operates at atmospheric pressure are presented. Electron and ion kinetic information that is not available from previous fluid studies is reported. Despite the high collisionality at atmospheric pressure, electrons are found to be in nonequilibrium. Similar to large-scale low-pressure dc discharges, the electron energy probability function (EEPF) in the bulk plasma presents three temperatures near the cathode, and it evolves into a bi-Maxwellian distribution as electrons approach the anode. The bi-Maxwellian character of the EEPF in the elastic energy region is not accounted for in fluid models, and as a result, PIC-MCC simulations predict a lower electron temperature than fluid models. The mean energy of ions that are impinging on the cathode is found to be significantly lower than in low-pressure discharges due to the large collisionality of the sheaths.
Description: This article was published in the journal IEEE transactions on plasma science [© IEEE] and is also available at: http://ieeexplore.ieee.org/servlet/opac?punumber=27 Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
URI: https://dspace.lboro.ac.uk/2134/3214
ISSN: 0093-3813
Appears in Collections:Published Articles (Electronic, Electrical and Systems Engineering)

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