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Please use this identifier to cite or link to this item: https://dspace.lboro.ac.uk/2134/3635

Title: Analysis of mutually incoherent symmetrical illumination for electronic speckle pattern shearing interferometry
Authors: Roman, Juan F.
Moreno, Vicente
Petzing, Jon N.
Tyrer, John R.
Keywords: Speckle
Interferometry
Strain
ESPI
ESPSI
Issue Date: 2006
Publisher: © Taylor & Francis
Citation: ROMAN, J.F. ... et al, 2006. Analysis of mutually incoherent symmetrical illumination for electronic speckle pattern shearing interferometry. Journal of Modern Optics, 53 (11), pp. 1541–1559 [DOI: 10.1080/09500340600578047]
Abstract: A speckle shearing interferometer has been designed using symmetrical mutually incoherent illumination, in an effort to provide measurements of in-plane strain. An analysis of the sensitivity to displacement and strain of this interferometer is presented, together with analysis of the optical phase extraction of the resultant fringe pattern. This interferometer is an improvement on previous designs as it provides information on the in-plane strain separated from components of the displacement. Experimental results provide qualitative data in the form of fringe patterns in support of the theoretical analysis.
Description: This article was published in the journal, Journal of Modern Optics, and the definitive version is available at: http://www.tandf.co.uk/journals/titles/09500340.asp
URI: https://dspace.lboro.ac.uk/2134/3635
ISSN: 0950–0340
1362–3044
Appears in Collections:Published Articles (Mechanical and Manufacturing Engineering)

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