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|Title: ||Analysis of coherent symmetrical illumination for electronic speckle pattern shearing interferometry|
|Authors: ||Roman, Juan F.|
Petzing, Jon N.
Tyrer, John R.
|Issue Date: ||2005|
|Publisher: ||© Taylor & Francis|
|Citation: ||ROMAN, J.F. ... et al, 2005. Analysis of coherent symmetrical illumination for electronic speckle pattern shearing interferometry. Journal of Modern Optics, 52 (6), pp. 797–812.|
|Abstract: ||In an effort to find a non-contact technique capable of providing measurements of in-plane strain, the authors designed a speckle shearing interferometer using symmetrical coherent illumination. It is presented the analysis of the sensitivity to displacement and strain of this interferometer, together with the analysis of the phase-stepping of the resultant fringe patterns. A new notation is introduced alongside this analysis to define the interference components in speckle shearing interferometers using multiple illumination beams. Experimental results show the fringe patterns and the phase stepping, in support of the theoretical analysis.|
|Description: ||This article was published in the journal, Journal of Modern Optics, and the definitive version is available at: http://www.tandf.co.uk/journals/titles/09500340.asp|
|Appears in Collections:||Published Articles (Mechanical, Electrical and Manufacturing Engineering)|
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