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Please use this identifier to cite or link to this item: https://dspace.lboro.ac.uk/2134/5124

Title: Accelerated testing of performance of thin film module
Authors: Vorasayan, Pongpan
Betts, Thomas R.
Gottschalg, Ralph
Tiwari, A.N.
Issue Date: 2008
Publisher: PVSAT / © The authors
Citation: VORASAYAN, P. ... et al, 2008. Accelerated testing of performance of thin film module. IN: Hutchins, M. and Pearsall, N. (eds.) . 4th Photovoltaic Science Application and Technology (PVSAT-4) Conference and Exhibition, 2-4 April 2008, University of Bath.
Abstract: There is an interest in identifying localised effects when investigating durability of devices. The combination of tests might also have an influence on test results. This is investigated for single junction amorphous silicon modules. The modules were put under accelerated testing including thermal cycling, light soaking and annealing test. I-V measurement and LBIC system as characterisation tools are used to investigate the possible degradation occurring in the devices both before and after certain stages of the test. Results have shown that there is a difference between modules which have experienced light soaking before being exposed to thermal cycling, indicating that the initial light soaking resulted in a UV activation of the material, which then changed the durability of the lamination.
Description: This is a conference paper.
Version: Accepted for publication
URI: https://dspace.lboro.ac.uk/2134/5124
ISBN: 0904963733
Appears in Collections:Conference Papers and Contributions (Electronic, Electrical and Systems Engineering)
Conference Papers and Contributions (CREST)

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