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|Title: ||Accelerated testing of performance of thin film module|
|Authors: ||Vorasayan, Pongpan|
Betts, Thomas R.
|Issue Date: ||2008|
|Publisher: ||PVSAT / © The authors|
|Citation: ||VORASAYAN, P. ... et al, 2008. Accelerated testing of performance of thin film module. IN: Hutchins, M. and Pearsall, N. (eds.) . 4th Photovoltaic Science Application and Technology (PVSAT-4) Conference and Exhibition, 2-4 April 2008, University of Bath.|
|Abstract: ||There is an interest in identifying localised
effects when investigating durability of devices.
The combination of tests might also have an
influence on test results. This is investigated
for single junction amorphous silicon modules.
The modules were put under accelerated
testing including thermal cycling, light soaking
and annealing test. I-V measurement and LBIC
system as characterisation tools are used to
investigate the possible degradation occurring
in the devices both before and after certain
stages of the test. Results have shown that
there is a difference between modules which
have experienced light soaking before being
exposed to thermal cycling, indicating that the
initial light soaking resulted in a UV activation
of the material, which then changed the
durability of the lamination.|
|Description: ||This is a conference paper.|
|Version: ||Accepted for publication|
|Appears in Collections:||Conference Papers (Electronic, Electrical and Systems Engineering)|
Conference Papers and Contributions (CREST)
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