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Please use this identifier to cite or link to this item: https://dspace.lboro.ac.uk/2134/5126

Title: Large area LBIC measurement system for thin film photovoltaic modules
Authors: Vorasayan, Pongpan
Bliss, Martin
Betts, Thomas R.
Gottschalg, Ralph
Tiwari, A.N.
Keywords: LBIC
Issue Date: 2006
Publisher: © Solar Energy Society (UK-ISES) / © The authors
Citation: VORASAYAN, P. ... et al, 2006. Large area LBIC measurement system for thin film photovoltaic modules. IN: Eurosun 2006 Conference Proceedings, Glasgow Caledonian University, Scotland.
Abstract: A laser beam induced current system has been developed for large area thin film technology. Employing a non-destructive laser scanning approach, such a system is used as a characterisation tool that is able to perform local performance investigation and allows efficient defect detection in large scale devices. In this paper, the results are shown for large area single junction amorphous silicon modules. The scanning images reveal an inhomogeneous current signal. Cross-section analysis illustrates that in some modules, there is considerable performance variation between cells. Certain cells are nearly or completely inactive. Interconnection problems, tiny cracks and defects that cannot be detected by visual inspection can also be identified.
Description: This is a conference paper. Further details of the conference are available at: http://www.eurosun2006.org/
Version: Accepted for publication
URI: https://dspace.lboro.ac.uk/2134/5126
ISBN: 0904963731
Appears in Collections:Conference Papers and Contributions (Electronic, Electrical and Systems Engineering)
Conference Papers and Contributions (CREST)

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