Zhang_Wang_Kong_2005.pdf (580.18 kB)
Two-dimensional simulation of a low-current dielectric barrier discharge in atmospheric helium
journal contribution
posted on 2009-08-20, 13:15 authored by Yuan Tao Zhang, De Zhen Wang, Michael G. KongA two-dimensional computational study is presented to unravel radial structure of a dielectric barrier discharge in atmospheric helium when the gas voltage exceeds slightly the breakdown voltage and the discharge current is low to retain a repetitive dynamic pattern of one discharge event every half cycle of the applied voltage. Simulation results reveal that during each half cycle of the applied voltage gas breakdown occurs first in a central region around the electrode axis. After it is extinguished, a second breakdown is triggered in the boundary region near the radial edge of the two electrodes as confirmed by the dynamic evolution of the radial profile of the electric field, the current density and the charged particles. These predictions are consistent with relevant experimental observations in literature. It is also shown that an increase in the applied voltage or in the excitation frequency reduces the time delay between the two breakdown events and the difference between their corresponding current densities. This offers a route to improve the uniformity of atmospheric dielectric barrier discharges for their intended applications.
History
School
- Mechanical, Electrical and Manufacturing Engineering
Citation
ZHANG, Y.T., WANG, D.Z. and KONG, M.G., 2005. Two-dimensional simulation of a low-current dielectric barrier discharge in atmospheric helium. Journal of Applied Physics, 98 (11), article no. 113308, pp.1-6.Publisher
© American Institute of PhysicsVersion
- VoR (Version of Record)
Publication date
2005Notes
Copyright 2005 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the authors and the American Institute of Physics. This article appeared in the Journal of Applied Physics and may be found at: http://link.aip.org/link/?JAPIAU/98/113308/1ISSN
0021-8979Language
- en