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|Title: ||Complex dynamic behaviors of nonequilibrium atmospheric dielectric-barrier discharges|
|Authors: ||Zhang, Yuan Tao|
Wang, De Zhen
Kong, Michael G.
Plasma transport processes
|Issue Date: ||2006|
|Publisher: ||© American Institute of Physics|
|Citation: ||ZHANG, Y.T., WANG, D.Z. and KONG, M.G., 2006. Complex dynamic behaviors of nonequilibrium atmospheric dielectric-barrier discharges. Journal of Applied Physics, 100 (6), article 063304, pp. 1-9.|
|Abstract: ||In this paper, a one-dimensional fluid model is used to investigate complex dynamic behaviors of a nonequilibrium dielectric-barrier discharge (DBD) in atmospheric helium. By projecting its evolution trajectory in the three-dimensional phase space of gas voltage, discharge current density, and electrode-surface charge density, the atmospheric DBD is shown to undergo a sequence of complex bifurcation processes when the applied voltage is increased from prebreakdown to many times of the breakdown voltage. Once the gas voltage exceeds the breakdown voltage, the discharge plasma is found to acquire negative differential conductivity and as a result its stability is compromised. For atmospheric DBD, however, the resulting low plasma stability is mitigated by a rapid accumulation of surface charges on the electrodes, thus allowing the atmospheric DBD to retain their character as a glow discharge. At certain values of the applied voltage, a highly complex phenomenon of period multiplication is observed in which the period of the discharge current is three times that of the applied voltage. This suggests that nonequilibrium atmospheric DBD may support evolution patterns that are quasiperiodic or even chaotic. These complex dynamic behaviors are likely to be critical to a full understanding of plasma stability of nonequilibrium atmospheric discharges and to the development of their instability control strategies.|
|Description: ||Copyright 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the authors and the American Institute of Physics. This article appeared in the Journal of Applied Physics and may be found at: http://link.aip.org/link/?JAPIAU/100/063304/1|
|Appears in Collections:||Published Articles (Electronic, Electrical and Systems Engineering)|
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