Loughborough University
Leicestershire, UK
LE11 3TU
+44 (0)1509 263171
Loughborough University

Loughborough University Institutional Repository

Please use this identifier to cite or link to this item: https://dspace.lboro.ac.uk/2134/5207

Title: Effect of module degradation on inverter sizing
Authors: Zhu, Jiang
Brundlinger, Roland
Betts, Thomas R.
Gottschalg, Ralph
Issue Date: 2008
Publisher: © IEEE
Citation: ZHU, J. ... et al, 2008. Effect of module degradation on inverter sizing. IN: 33rd IEEE Photovolatic Specialists Conference, San Diego, CA, 11-16 May 2008, Conference Proceedings.
Abstract: The effect of amorphous Silicon (a-Si) module degradation on inverter sizing is investigated in this paper to identify appropriate sizing ratios even if only undegraded data-sheet values are available. The seasonal degradation and annealing pattern of a-Si modules requires special attention to the sizing of inverters for these devices, as is demonstrated in this paper for three types of modules with different degradation rates. The efficiency of the inverters depends on the sizing ratio as well as the DC input voltage. Here data of an inverter with relatively dependence on operating voltage is used. As modules degrade, the optimum ratio of system rated power with respect to inverter nominal power increases by 10 to 15% for the specific inverter. Considering the module life-time, the inverter size chosen to be matched to the degraded power and voltage rating achieves high efficiency over the life-time of the modules, while the inverter chosen to match initial values, as given by some manufacturers on their datasheets, can add about ten percent losses to the operation.
Description: This conference paper is also available at: http://ieeexplore.ieee.org/servlet/opac?punumber=4815197 © 2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Version: Published
DOI: 10.1109/PVSC.2008.4922867
URI: https://dspace.lboro.ac.uk/2134/5207
ISBN: 9781424416400
ISSN: 0160-8371
Appears in Collections:Conference Papers and Contributions (Electronic, Electrical and Systems Engineering)
Conference Papers and Contributions (CREST)

Files associated with this item:

File Description SizeFormat
Zhu et al_IEEE_2008.pdf3.88 MBAdobe PDFView/Open

 

SFX Query

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.