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|Title: ||Effects of dielectric barriers in radio-frequency atmospheric glow discharges|
|Authors: ||Shi, J.J.|
Kong, Michael G.
|Keywords: ||Atmospheric pressure glow discharges (APGD)|
Dielectric barrier discharges (DBD)
|Issue Date: ||2007|
|Publisher: ||© IEEE|
|Citation: ||SHI, J.J., LIU, D.W. and KONG, M.G., 2007. Effects of dielectric barriers in radio-frequency atmospheric glow discharges. IEEE Transactions on Plasma Science, 35(2), part 1, pp.137-142.|
|Abstract: ||This paper reports the effects of introducing dielectric
barriers to radio-frequency (RF) atmospheric pressure glow
discharges (APGD) that have hitherto employed bare electrodes.
The resulting atmospheric RF dielectric barrier discharges (DBD)
are experimentally shown to retain their large volume without
constriction at very large currents, well above the maximum
current at which conventional RF APGD with bare electrodes
can maintain their plasma stability. Optical emission spectroscopy
is used to demonstrate that larger discharge currents lead to
more active plasma chemistry. A complementary computational
study is then presented on the dynamics and structures of the
RF DBD under different operation conditions. While the RF DBD
and conventional RF APGD may present very different electrical
signatures in the external circuit, it is shown that their discharge
properties, particularly the sheath characteristics, are very similar.
Finally, it is demonstrated that thinner dielectric barriers
or/and larger excitation frequencies are desirable to maximize the
largest permissible discharge current without compromising the
|Description: ||This article was published in the journal, IEEE Transactions on Plasma Science [© IEEE 2007] and is also available at: http://ieeexplore.ieee.org/ Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.|
|Appears in Collections:||Published Articles (Electronic, Electrical and Systems Engineering)|
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