+44 (0)1509 263171
Please use this identifier to cite or link to this item:
|Title: ||Creep analysis of a lead-free surface mount device|
|Authors: ||Hegde, Pradeep|
Whalley, David C.
Silberschmidt, Vadim V.
|Issue Date: ||2007|
|Publisher: ||© IEEE|
|Citation: ||HEGDE, P., WHALLEY, D. and SILBERSCHMIDT, V.V., 2007. Creep analysis of a lead-free surface mount device. IN: International Conference on Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, (EuroSime 2007), London, 16-18 April, pp. 1-7.|
|Abstract: ||In this paper finite element analysis (FEA) is used to understand the effect of a non-uniform temperature distribution on the creep and fatigue behaviour of lead-free solder joints in an electronic assembly comprising of a chip resistor mounted on printed circuit board (PCB). Solder joints in surface mount devices (SMDs) operate over a temperature range as extreme as -55degC to 125degC, which is high compared to the melting temperature of solder alloys. Exposure of solder joints to these temperatures can result in thermo-mechanical fatigue. Eutectic or near- eutectic tin-lead alloys have previously been used as an interconnection material, but the ban imposed on the use of toxic materials in electronic products demands new lead-free solder materials. This paper presents the experiments carried out using a thermal camera to obtain the real temperature distribution in the electronic assembly. These temperature distributions were used in FEA of the chip resistor under temperature cycling conditions. Unlike accelerated tests for obtaining reliability data, FEA is quick and less expensive.|
|Description: ||This is a conference paper [© IEEE]. It is also available at: http://ieeexplore.ieee.org/ Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.|
|Appears in Collections:||Conference Papers (Mechanical and Manufacturing Engineering)|
Files associated with this item:
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.