+44 (0)1509 263171
Please use this identifier to cite or link to this item:
|Title: ||Automated characterisation of multi-junction thin film silicon solar cells|
|Authors: ||Bliss, Martin|
Hibberd, Christopher J.
Betts, Thomas R.
|Keywords: ||Multijunction Solar Cell|
|Issue Date: ||2009|
|Publisher: ||© WIP-Renewable Energies|
|Citation: ||BLISS, M. ... et al, 2009. Automated characterisation of multi-junction thin film silicon solar cells. IN: Proceedings of the 24th European Photovoltaic Solar Energy Conference, Hamburg, Germany, 21st-25th September, paper 3AV.2.32.|
|Abstract: ||Accurate measurements and calibration of amorphous silicon and micromorph multi-junction solar
cells poses a major challenge. Device measurements with commonly used single-lamp solar simulators can be
associated with large uncertainties, as small changes in the simulator light can lead to significant non-linear
differences in the current production of the device under test. To properly characterise multi-junction solar cells, a
multi-source or spectrally adjustable solar simulator is required. This way, the spectral distribution of the simulator
can be changed and stacked cells can be current matched. However, the methods available are somewhat slow, as
they require the measurement of a quantum efficiency, and difficult to operate when done manually.
This paper presents a method for automated characterisation of multi-junction and single-junction solar cells. Its key
element is a fitting method for the spectral response from device measurements at different spectra. The automated
approach is underlined with a simulated measurement of a double junction amorphous silicon cell. Simulations reflect
the capabilities of the LED-based solar simulator prototype developed at CREST. Results show that the method is
able to deliver high accuracy without the need for additional spectral response measurement systems or closely
matched reference cells. Single- and multi-junction device calibration methods are briefly reviewed and the
automated approach is described in detail including its potential error sources and requirements.|
|Description: ||This conference paper is closed access. It was presented at the the 24th EUPVSEC: www.photovoltaic-conference.com|
|Version: ||Closed access|
|Appears in Collections:||Closed Access (Mechanical, Electrical and Manufacturing Engineering)|
Files associated with this item:
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.