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Title: Removal of the eye-blink artifacts from EEGs via STF-TS modeling and robust minimum variance beamforming
Authors: Nazarpour, K.
Wongsawat, Yodchanan
Sanei, Saeid
Chambers, Jonathon
Oraintara, Soontorn
Keywords: Eye-blink
Artifact removal,
Parallel factor analysis
Robust minimum variance beamformer
Space time frequency
Issue Date: 2008
Publisher: © IEEE
Citation: Nazarpour, K.. ... et al., 2008. Removal of the eye-blink artifacts from EEGs via STF-TS modeling and robust minimum variance beamforming, 55 (9), pp 2221-2231.
Abstract: A novel scheme for the removal of eye-blink (EB) artifacts from electroencephalogram (EEG) signals based on a novel space–time–frequency (STF) model of EEGs and robust minimum variance beamformer (RMVB) is proposed. In this method, in order to remove the artifact, the RMVB is provided with a priori information, namely, an estimation of the steering vector corresponding to the point source EB artifact. The artifact-removed EEGs are subsequently reconstructed by deflation. The a priori knowledge, the vector corresponding to the spatial distribution of the EB factor, is identified using the STF model of EEGs, provided by the parallel factor analysis (PARAFAC) method. In order to reduce the computational complexity present in the estimation of the STF model using the three-way PARAFAC, the time domain is subdivided into a number of segments, and a four-way array is then set to estimate the STF-time/segment (TS) model of the data using the four-way PARAFAC. The correct number of the factors of the STF model is effectively estimated by using a novel core consistency diagnostic- (CORCONDIA-) based measure. Subsequently, the STF-TS model is shown to closely approximate the classic STF model, with significantly lower computational cost. The results confirm that the proposed algorithm effectively identifies and removes the EB artifact from raw EEG measurements.
Description: This article was published in the journal IEEE Transactions on Biomedical Engineering [© IEEE] and is also available at: http://ieeexplore.ieee.org/ Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Version: Published
DOI: 10.1109/TBME.2008.919847
URI: https://dspace.lboro.ac.uk/2134/5828
ISSN: 0018-9294
Appears in Collections:Published Articles (Mechanical, Electrical and Manufacturing Engineering)

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