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Title: Detection of cell-cyclic elements in mis-sampled gene expression data using a robust Capon estimator
Authors: Bowles, Thomas
Jakobsson, Andreas
Chambers, Jonathon
Issue Date: 2004
Publisher: © IEEE
Citation: BOWLES, T., JAKOBSSON, A. and CHAMBERS, J.A., 2004. Detection of cell-cyclic elements in mis-sampled gene expression data using a robust Capon estimator. IN: Proceedings of 2004 IEEE International Conference on Acoustics, Speech, and Signal Processing (ICASSP '04), Montreal, Quebec, 17-21 May, Vol. 5, pp. 17-20
Abstract: We present a method for the estimation of possible cell cyclic elements in mis-sampled microarray data. Accurate assessment of the frequency content of microarray data gives insight into genes which could be cell-cycle regulated. Cell cycle regulation is one component of the complex network of genetic regulatory processes and is especially relevant to the study of cancer. As cDNA microarray experiments involve human sampling of cell populations, slight variations in the sampling times invariably occur. Here, we propose estimating the frequency content of microarray data using the recent robust Capon estimator, and formulate a suitable uncertainty region to minimize over. The estimator is shown to yield robust estimates with real microarray data and to identify cell-cyclic genes that elude both the traditional Periodogram and the Capon spectral estimator.
Description: This is a conference paper [© IEEE]. It is also available at: http://ieeexplore.ieee.org/ Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Version: Accepted for publication
DOI: 10.1109/ICASSP.2004.1327136
URI: https://dspace.lboro.ac.uk/2134/5910
ISBN: 0780384849
Appears in Collections:Conference Papers and Contributions (Electronic, Electrical and Systems Engineering)

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