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Please use this identifier to cite or link to this item: https://dspace.lboro.ac.uk/2134/5928

Title: Depth-resolved whole-field displacement measurement using wavelength scanning interferometry
Authors: Ruiz, Pablo D.
Zhou, Yanzhou
Huntley, Jonathan M.
Wildman, Ricky D.
Keywords: Depth-resolved
Displacement measurements
Wavelength scanning interferometry
Phase shifting
Wavelength tuning
Issue Date: 2004
Publisher: © Institute of Physics
Citation: RUIZ, P.D. ... et al, 2004. Depth-resolved whole-field displacement measurement using wavelength scanning interferometry. Journal of Optics A: Pure and Applied Optics, 6 (7), pp. 679-683.
Abstract: We describe a technique for measuring depth-resolved displacement fields within a 3-dimensional (3-D) scattering medium based on wavelength scanning interferometry. Sequences of 2-dimensional interferograms are recorded whilst the wavelength of the laser is tuned at constant rate. Fourier transformation of the resulting 3-D intensity distribution along the time axis reconstructs the scattering potential within the medium, and changes in the 3-D phase distribution measured between two separate scans provides one component of the 3-D displacement field. The technique is illustrated with a proof-of-principle experiment involving two independently controlled reflecting surfaces. Advantages over the corresponding method based on low coherence interferometry include a depth range unlimited by mechanical scanning devices, and immunity from fringe contrast reduction when imaging through dispersive media.
Description: This article was published in the Journal of Optics A: Pure and Applied Optics [© IOP] and the definitive version can be found at: http://dx.doi.org/10.1088/1464-4258/6/7/004
Version: Accepted for publication
DOI: 10.1088/1464-4258/6/7/004
URI: https://dspace.lboro.ac.uk/2134/5928
ISSN: 1464-4258
Appears in Collections:Published Articles (Mechanical, Electrical and Manufacturing Engineering)

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